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1

S2k guidelines for the diagnosis and treatment of herpes zoster and postherpetic neuralgia

Gross, Gerd E., Eisert, Lisa, Doerr, Hans Wilhelm, Fickenscher, Helmut, Knuf, Markus, Maier, Philip, Maschke, Matthias, Müller, Rainer, Pleyer, Uwe, Schäfer, Michael, Sunderkötter, Cord, Werner, Ricar

Journal:

JDDG: Journal der Deutschen Dermatologischen Gesellschaft

Année:

2020

Langue:

english

Fichier:

PDF, 305 KB

english, 2020

2

SPIE Proceedings [SPIE 28th European Mask and Lithography Conference (EMLC 2012) - Dresden, Germany (Tuesday 17 January 2012)] 28th European Mask and Lithography Conference - PSM and thin OMOG reticles aerial imaging metrology comparison study

Cohen, Yaron, Finders, Jo, Mangan, Shmoolik, Englard, Ilan, Mouraille, Orion, Janssen, Maurice, Miyazaki, Junji, Connolly, Brid, Kojima, Yosuke, Higuchi, Masaru, Behringer, Uwe F.W., Maurer, Wilhelm

Année:

2012

Langue:

english

Fichier:

PDF, 2.45 MB

english, 2012

3

Behandlung und Begutachtung von Transsexuellen

Sophinette Becker, Hartmut A.G. Bosinski, Ulrich Clement, Wolf Eicher, Thomas M. Goerlich, Uwe Hartmann, Götz Kockott, Dieter Langer, Wilhelm F. Preuss, Gunter Schmidt, Alfred Springer, Reinhard Wille

Journal:

Psychotherapeut

Année:

1997

Langue:

german

Fichier:

PDF, 194 KB

german, 1997

4

Crataegus Special Extract WS®1442 Induces an Endothelium-Dependent, NO-mediated Vasorelaxation via eNOS-Phosphorylation at Serine 1177

Klara Brixius, Sonja Willms, Andreas Napp, Paschalios Tossios, Dennis Ladage, Wilhelm Bloch, Uwe Mehlhorn, Robert H. G. Schwinger

Journal:

Cardiovascular Drugs and Therapy

Année:

2006

Langue:

english

Fichier:

PDF, 387 KB

english, 2006

5

SPIE Proceedings [SPIE 29th European Mask and Lithography Conference - Dresden, Germany (Tuesday 25 June 2013)] 29th European Mask and Lithography Conference - Dose variation and charging due to fogging in electron beam lithography: simulations using CHARIOT Monte Carlo software

Babin, Sergey, Borisov, Sergey, Patyukova, Elena, Behringer, Uwe F. W., Maurer, Wilhelm

Année:

2013

Langue:

english

Fichier:

PDF, 619 KB

english, 2013

6

Comprehensive study of the influence of aging on the hysteresis behavior of a lithium iron phosphate cathode-based lithium ion battery – An experimental investigation of the hysteresis

Marongiu, Andrea, Nußbaum, Felix Gerd Wilhelm, Waag, Wladislaw, Garmendia, Maitane, Sauer, Dirk Uwe

Journal:

Année:

2016

Langue:

english

Fichier:

PDF, 2.95 MB

english, 2016

7

SPIE Proceedings [SPIE 29th European Mask and Lithography Conference - Dresden, Germany (Tuesday 25 June 2013)] 29th European Mask and Lithography Conference - Scanner grid recipe creation improvement for tighter overlay specifications

Cotte, Eric, Kathiresan, Hariharasudhan, Ruhm, Matthias, Schulz, Bernd, Schulze, Uwe, Behringer, Uwe F. W., Maurer, Wilhelm

Année:

2013

Langue:

english

Fichier:

PDF, 281 KB

english, 2013

8

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, California (Monday 13 September 2010)] Photomask Technology 2010 - Advanced cleaning of nano-imprint lithography template in patterned media applications

Singh, Sherjang, Montgomery, M. Warren, Maurer, Wilhelm, Chen, Ssuwei, Dress, Peter, Kurataka, Nobuo, Gauzner, Gene, Dietze, Uwe

Année:

2010

Langue:

english

Fichier:

PDF, 12.37 MB

english, 2010

9

SPIE Proceedings [SPIE 28th European Mask and Lithography Conference (EMLC 2012) - Dresden, Germany (Tuesday 17 January 2012)] 28th European Mask and Lithography Conference - Investigation and mitigation of field-edge CDU fingerprint for ArFi lithography for 45-nm to sub-28-nm logic nodes

Le-Gratiet, Bertrand, Finders, Jo, Mouraille, Orion, Queens, Rene, Escalante, Maryana, Smeets, Bart, Beltman, Jan, Jullian, Karine, Behringer, Uwe F.W., Maurer, Wilhelm

Année:

2012

Langue:

english

Fichier:

PDF, 1.85 MB

english, 2012

10

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, California (Monday 19 September 2011)] Photomask Technology 2011 - Towards the prediction of pattern collapse hotspots for full-chip layouts

Sturtevant, John L., Maurer, Wilhelm, Abboud, Frank E., Dave, Aasutosh, Hollerbach, Uwe

Année:

2011

Langue:

english

Fichier:

PDF, 459 KB

english, 2011

11

Liquid-crystalline aromatic polyesters with phenylalkyl side chains

Wilhelm Brügging, Uwe Kampschulte, Hans-Werner Schmidt, Walter Heitz

Journal:

Macromolecular Chemistry and Physics

Année:

1988

Langue:

english

Fichier:

PDF, 633 KB

english, 1988

12

New ways of genterating organotion reactive intermediates for organic synthesis

Wilhelm P. Neumann, Horst Hillgärtner, Kim M. Baines, Rita Dicke, Klaus Vorspohl, Uwe Kobs, Udo Nussbeutel

Journal:

Année:

1989

Langue:

english

Fichier:

PDF, 450 KB

english, 1989

13

Effects of S-acetylglutathione in cell and animal model of herpes simplex virus type 1 infection

Jens-Uwe Vogel, Jaroslav Cinatl, Nurlan Dauletbaev, Sigune Buxbaum, Gernot Treusch, Jindrich Cinatl, Valentin Gerein, Hans Wilhelm Doerr

Journal:

Medical Microbiology and Immunology

Année:

2005

Langue:

english

Fichier:

PDF, 207 KB

english, 2005

14

10.1038/23468

Kaupp, U. Benjamin, Körschen, Heinz G., Beyermann, Michael, Müller, Frank, Heck, Martin, Vantler, Marius, Koch, Karl-Wilhelm, Kellner, Roland, Wolfrum, Uwe, Bode, Christian, Hofmann, Klaus Peter

Journal:

Année:

1999

Langue:

english

Fichier:

PDF, 311 KB

english, 1999

15

Mesenchymal stem cells transmigrate over the endothelial barrier

Annette Schmidt, Dennis Ladage, Caroline Steingen, Klara Brixius, Timo Schinköthe, Franz-Josef Klinz, Robert H.G. Schwinger, Uwe Mehlhorn, Wilhelm Bloch

Journal:

European Journal of Cell Biology

Année:

2006

Langue:

english

Fichier:

PDF, 640 KB

english, 2006

16

Human Mitochondrial 3,2-trans-Enoyl-CoA Isomerase (DCI): Gene Structure and Localization to Chromosome 16p13.3

Uwe Janssen, Thomas Fink, Peter Lichter, Wilhelm Stoffel

Journal:

Année:

1994

Fichier:

PDF, 446 KB

1994

17

Improvement of early recognition of lentigo maligna using dermatoscopy

Roman Schiffner, Julia Schiffner-Rohe, Thomas Vogt, Michael Landthaler, Uwe Wlotzke, Armand B. Cognetta, Wilhelm Stolz

Journal:

Journal of the American Academy of Dermatology

Année:

2000

Langue:

english

Fichier:

PDF, 458 KB

english, 2000

18

Standardized Flexible Ureteroscopic Technique to Improve Stone-free Rates

Miernik, Arkadiusz, Wilhelm, Konrad, Ardelt, Peter Uwe, Adams, Fabian, Kuehhas, Franklin Emmanuel, Schoenthaler, Martin

Journal:

Année:

2012

Langue:

english

Fichier:

PDF, 142 KB

english, 2012

19

Die deutsche Braunkohlenindustrie im Jahr 2012

Maaßen, Uwe, Schiffer, Hans-Wilhelm

Journal:

Année:

2013

Langue:

german

Fichier:

PDF, 399 KB

german, 2013

20

Die deutsche Braunkohlenindustrie im Jahr 2013

Maaßen, Uwe, Schiffer, Hans-Wilhelm

Journal:

Année:

2014

Langue:

german

Fichier:

PDF, 495 KB

german, 2014

21

Pallidal Deep-Brain Stimulation in Primary Generalized or Segmental Dystonia

Kupsch, Andreas, Benecke, Reiner, Müller, Jörg, Trottenberg, Thomas, Schneider, Gerd-Helge, Poewe, Werner, Eisner, Wilhelm, Wolters, Alexander, Müller, Jan-Uwe, Deuschl, Günther, Pinsker, Marcus O., S

Journal:

Boston Medical and Surgical Journal

Année:

2006

Langue:

english

Fichier:

PDF, 335 KB

english, 2006

22

Tonic contractions of the tensor tympani muscle: a key to some non-specific middle ear symptoms? Hypothesis and data from temporal bone experiments

Pau, Hans Wilhelm, Punke, Christoph, Zehlicke, Thorsten, Dressler, Dirk, Sievert, Uwe

Journal:

Acta Oto-Laryngologica

Année:

2005

Langue:

english

Fichier:

PDF, 388 KB

english, 2005

23

Structural and electrical characterization of PZT and PLZT films grown on spin-on processed conductive oxide electrodes

Klee, Mareike, Mackens, Uwe, Hermann, Wilhelm, Bathelt, Erich

Journal:

Integrated Ferroelectrics

Année:

1995

Langue:

english

Fichier:

PDF, 1.11 MB

english, 1995

24

[Lecture Notes in Computer Science] Electronic Commerce Volume 2232 || Multidimensional Recommender Systems: A Data Warehousing Approach

Fiege, Ludger, Mühl, Gero, Wilhelm, Uwe

Année:

2001

Langue:

english

Fichier:

PDF, 525 KB

english, 2001

25

SPIE Proceedings [SPIE SPIE LASE - San Francisco, California (Saturday 22 January 2011)] Laser-based Micro- and Nanopackaging and Assembly V - Multi-spot laser processing of crystalline solar cells

Haupt, Oliver, Schütz, Viktor, Stute, Uwe, Pfleging, Wilhelm, Lu, Yongfeng, Washio, Kunihiko

Année:

2011

Langue:

english

Fichier:

PDF, 1.72 MB

english, 2011

26

SPIE Proceedings [SPIE 29th European Mask and Lithography Conference - Dresden, Germany (Tuesday 25 June 2013)] 29th European Mask and Lithography Conference - Thermal probe nanolithography: in-situ inspection, high-speed, high-resolution, 3D

Holzner, Felix, Paul, Philip, Despont, Michel, Cheong, Lin Lee, Hedrick, James, Dürig, Urs, Knoll, Armin, Behringer, Uwe F. W., Maurer, Wilhelm

Année:

2013

Langue:

english

Fichier:

PDF, 756 KB

english, 2013

27

SPIE Proceedings [SPIE 29th European Mask and Lithography Conference - Dresden, Germany (Tuesday 25 June 2013)] 29th European Mask and Lithography Conference - Application of Mueller matrix spectroscopic ellipsometry to determine line edge roughness on photomasks

Heinrich, A., Dirnstorfer, I., Bischoff, J., Richter, U., Ketelson, H., Meiner, K., Mikolajick, T., Behringer, Uwe F. W., Maurer, Wilhelm

Année:

2013

Langue:

english

Fichier:

PDF, 1.06 MB

english, 2013

28

Proteome profiles of HDL particles of patients with chronic heart failure are associated with immune response and also include bacteria proteins

Oberbach, Andreas, Adams, Volker, Schlichting, Nadine, Heinrich, Marco, Kullnick, Yvonne, Lehmann, Stefanie, Lehmann, Sven, Feder, Stefan, Correia, Joao Carlos, Mohr, Friedrich-Wilhelm, Völker, Uwe, J

Journal:

Clinica Chimica Acta

Année:

2016

Langue:

english

Fichier:

PDF, 1.39 MB

english, 2016

29

SPIE Proceedings [SPIE 29th European Mask and Lithography Conference - Dresden, Germany (Tuesday 25 June 2013)] 29th European Mask and Lithography Conference - Changing technology requirements of mask metrology

Roeth, Klaus-Dieter, Wagner, Mark, Laske, Frank, Behringer, Uwe F. W., Maurer, Wilhelm

Année:

2013

Langue:

english

Fichier:

PDF, 922 KB

english, 2013

30

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, California (Monday 19 September 2011)] Photomask Technology 2011 - Effects of cleaning on NIL templates: surface roughness, CD, and pattern integrity

Singh, Sherjang, Maurer, Wilhelm, Abboud, Frank E., Onuki, Kenji, Kawamata, Naoshi, Nagai, Takaharu, Kurihara, Masaaki, Tomita, Tatsuya, Hayashi, Naoya, Dress, Peter, Dietze, Uwe

Année:

2011

Langue:

english

Fichier:

PDF, 3.69 MB

english, 2011

31

SPIE Proceedings [SPIE 29th European Mask and Lithography Conference - Dresden, Germany (Tuesday 25 June 2013)] 29th European Mask and Lithography Conference - Actinic characterization and modeling of the EUV mask stack

Philipsen, Vicky, Hendrickx, Eric, Jonckheere, Rik, Davydova, Natalia, Fliervoet, Timon, Neumann, Jens Timo, Behringer, Uwe F. W., Maurer, Wilhelm

Année:

2013

Langue:

english

Fichier:

PDF, 1.91 MB

english, 2013

32

SPIE Proceedings [SPIE 26th European Mask and Lithography Conference - Grenoble, France (Monday 18 January 2010)] 26th European Mask and Lithography Conference - Low voltage resist processes developed for MAPPER tool first exposures

Rio, D., Behringer, Uwe F.W., Maurer, Wilhelm, Constancias, C., van Nieuwstadt, J., Vijverberg, J., Derrough, S., Icard, B., Pain, L.

Année:

2010

Langue:

english

Fichier:

PDF, 5.04 MB

english, 2010

33

SPIE Proceedings [SPIE 28th European Mask and Lithography Conference (EMLC 2012) - Dresden, Germany (Tuesday 17 January 2012)] 28th European Mask and Lithography Conference - Cleaning aspects of material choice for high end mask manufacturing

Nesladek, Pavel, Osborne, Steve, Rümmelin, Stefan, Behringer, Uwe F.W., Maurer, Wilhelm

Année:

2012

Langue:

english

Fichier:

PDF, 713 KB

english, 2012

34

SPIE Proceedings [SPIE 28th European Mask and Lithography Conference (EMLC 2012) - Dresden, Germany (Tuesday 17 January 2012)] 28th European Mask and Lithography Conference - Mask write time reduction: deployment of advanced approaches and their impact on established work models

Schulze, S. F., Elayat, A., Lin, T., Sahouria, E., Behringer, Uwe F.W., Maurer, Wilhelm

Année:

2012

Langue:

english

Fichier:

PDF, 833 KB

english, 2012

35

SPIE Proceedings [SPIE 28th European Mask and Lithography Conference (EMLC 2012) - Dresden, Germany (Tuesday 17 January 2012)] 28th European Mask and Lithography Conference - EUV mask defects and their removal

Rastegar, Abbas, Jindal, Vibhu, Behringer, Uwe F.W., Maurer, Wilhelm

Année:

2012

Langue:

english

Fichier:

PDF, 2.77 MB

english, 2012

36

SPIE Proceedings [SPIE 29th European Mask and Lithography Conference - Dresden, Germany (Tuesday 25 June 2013)] 29th European Mask and Lithography Conference - Model-based SRAF solutions for advanced technology nodes

Jayaram, Srividya, LaCour, Pat, Word, James, Tritchkov, Alexander, Behringer, Uwe F. W., Maurer, Wilhelm

Année:

2013

Langue:

english

Fichier:

PDF, 2.63 MB

english, 2013

37

SPIE Proceedings [SPIE 26th European Mask and Lithography Conference - Grenoble, France (Monday 18 January 2010)] 26th European Mask and Lithography Conference - Projection mask-less lithography and nanopatterning with electron and ion multi-beams

Klein, Christof, Behringer, Uwe F.W., Maurer, Wilhelm, Platzgummer, Elmar, Loeschner, Hans

Année:

2010

Langue:

english

Fichier:

PDF, 4.77 MB

english, 2010

38

SPIE Proceedings [SPIE 28th European Mask and Lithography Conference (EMLC 2012) - Dresden, Germany (Tuesday 17 January 2012)] 28th European Mask and Lithography Conference - Mask readiness for EUVL pilot line

Hayashi, Naoya, Abe, Tsukasa, Takikawa, Tadahiko, Behringer, Uwe F.W., Maurer, Wilhelm

Année:

2012

Langue:

english

Fichier:

PDF, 1.57 MB

english, 2012

39

SPIE Proceedings [SPIE 26th European Mask and Lithography Conference - Grenoble, France (Monday 18 January 2010)] 26th European Mask and Lithography Conference - Template masters for substrate conformal imprint lithography generated by charged particle nanopatterning techniques

van Delft, Falco, Behringer, Uwe F.W., Maurer, Wilhelm, van de Laar, Robert, Verschuuren, Marc, Platzgummer, Elmar, Loeschner, Hans

Année:

2010

Langue:

english

Fichier:

PDF, 8.67 MB

english, 2010

40

SPIE Proceedings [SPIE 26th European Mask and Lithography Conference - Grenoble, France (Monday 18 January 2010)] 26th European Mask and Lithography Conference - Mask lithography for display manufacturing

Sandstrom, T., Behringer, Uwe F.W., Maurer, Wilhelm, Ekberg, P.

Année:

2010

Langue:

english

Fichier:

PDF, 11.02 MB

english, 2010

41

SPIE Proceedings [SPIE 29th European Mask and Lithography Conference - Dresden, Germany (Tuesday 25 June 2013)] 29th European Mask and Lithography Conference - Improving inspectability of sub-2x-nm node masks with complex SRAF

Kang, In Yong, Yoon, Gisung, Lee, Jonghee, Chung, Donghoon Paul, Kim, Byung-Gook, Jeon, Chan-Uk, Inderhees, Gregg, Hutchinson, Trent, Cho, Wonil, Hur, Jiuk, Behringer, Uwe F. W., Maurer, Wilhelm

Année:

2013

Langue:

english

Fichier:

PDF, 7.39 MB

english, 2013

42

SPIE Proceedings [SPIE 29th European Mask and Lithography Conference - Dresden, Germany (Tuesday 25 June 2013)] 29th European Mask and Lithography Conference - Imaging challenges in 20nm and 14nm logic nodes: hot spots performance in Metal1 layer

Timoshkov, V., Rio, D., Liu, H., Gillijns, W., Wang, J., Wong, P., Van Den Heuvel, D., Wiaux, V., Nikolsky, P., Finders, J., Behringer, Uwe F. W., Maurer, Wilhelm

Année:

2013

Langue:

english

Fichier:

PDF, 959 KB

english, 2013

43

SPIE Proceedings [SPIE 28th European Mask and Lithography Conference (EMLC 2012) - Dresden, Germany (Tuesday 17 January 2012)] 28th European Mask and Lithography Conference - EUVL defect printability: an industry challenge

Kwon, Hyuk Joo, Teki, Ranganath, Harris-Jones, Jenah, Cordes, Aaron, Behringer, Uwe F.W., Maurer, Wilhelm

Année:

2012

Langue:

english

Fichier:

PDF, 4.15 MB

english, 2012

44

SPIE Proceedings [SPIE 28th European Mask and Lithography Conference (EMLC 2012) - Dresden, Germany (Tuesday 17 January 2012)] 28th European Mask and Lithography Conference - Improvements on Corner2, a lossless layout image compression algorithm for maskless lithography systems

Yang, Jeehong, Savari, Serap A., Behringer, Uwe F.W., Maurer, Wilhelm

Année:

2012

Langue:

english

Fichier:

PDF, 726 KB

english, 2012

45

SPIE Proceedings [SPIE 29th European Mask and Lithography Conference - Dresden, Germany (Tuesday 25 June 2013)] 29th European Mask and Lithography Conference - Status of the AIMS EUV development project

Garetto, Anthony, Peters, Jan Hendrik, Hellweg, Dirk, Weiss, Markus, Behringer, Uwe F. W., Maurer, Wilhelm

Année:

2013

Langue:

english

Fichier:

PDF, 2.37 MB

english, 2013

46

Characterization of a non-approved selective androgen receptor modulator drug candidate sold via the Internet and identification of in vitro generated phase-I metabolites for human sports drug testing

Thevis, Mario, Lagojda, Andreas, Kuehne, Dirk, Thomas, Andreas, Dib, Josef, Hansson, Annelie, Hedeland, Mikael, Bondesson, Ulf, Wigger, Tina, Karst, Uwe, Schänzer, Wilhelm

Journal:

Rapid Communications in Mass Spectrometry

Année:

2015

Langue:

english

Fichier:

PDF, 1.18 MB

english, 2015

47

SPIE Proceedings [SPIE 26th European Mask and Lithography Conference - Grenoble, France (Monday 18 January 2010)] 26th European Mask and Lithography Conference - Deep-UV KrF lithography for the fabrication of Bragg gratings on SOI rib waveguides

Bauer, J., Behringer, Uwe F.W., Maurer, Wilhelm, Stolarek, D., Zimmermann, L., Giuntoni, I., Haak, U., Richter, H., Marschmeyer, S., Gajda, A., Bruns, J., Petermann, K., Tillack, B.

Année:

2010

Langue:

english

Fichier:

PDF, 228 KB

english, 2010

48

SPIE Proceedings [SPIE 26th European Mask and Lithography Conference - Grenoble, France (Monday 18 January 2010)] 26th European Mask and Lithography Conference - Checkerboard pattern for PSF parameter determination in electron beam lithography

Gutsch, Manuela, Behringer, Uwe F.W., Maurer, Wilhelm, Choi, Kang-Hoon, Freitag, Martin, Hauptmann, Marc, Hohle, Christoph, Jaschinsky, Philipp, Keil, Katja

Année:

2010

Langue:

english

Fichier:

PDF, 10.70 MB

english, 2010

49

SPIE Proceedings [SPIE 26th European Mask and Lithography Conference - Grenoble, France (Monday 18 January 2010)] 26th European Mask and Lithography Conference - Mask phase and transmission variation effects on wafer critical dimensions for nodes 65nm and 45nm

Dufaye, F., Behringer, Uwe F.W., Maurer, Wilhelm, Gough, S., Sundermann, F., Farys, V., Miyashita, H., Sartelli, L., Perissinotti, F., Buttgereit, U., Perlitz, S., Birkner, R.

Année:

2010

Langue:

english

Fichier:

PDF, 700 KB

english, 2010

50

Mass spectrometric characterization of the hypoxia-inducible factor (HIF) stabilizer drug candidate BAY 85-3934 (molidustat) and its glucuronidated metabolite BAY-348, and their implementation into routine doping controls

Dib, Josef, Mongongu, Cynthia, Buisson, Corinne, Molina, Adeline, Schänzer, Wilhelm, Thuss, Uwe, Thevis, Mario

Journal:

Drug Testing and Analysis

Année:

2016

Langue:

english

Fichier:

PDF, 1.10 MB

english, 2016